Transmission Electron Microscopy (TEM) is a vital characterization tool for directly imaging nanomaterials to obtain quantitative measures of particle and/or grain size, size distribution, and morphology.
TEM images the transmission of a focused beam of electrons through a sample, forming an image in an analogous way to a light microscope (Figure 1). However, because electrons are used rather than light to illuminate the sample, TEM imaging has significantly higher resolution (by a factor of about 1000!) than light-based imaging techniques. Amplitude and phase variations in the transmitted beam provide imaging contrast that is a function of the sample thickness (the
amount of material that the electron beam must pass through) and the sample material (heavier atoms scatter more electrons and therefore have a smaller electron mean free path than lighter atoms).
NWAKPA, U. (2019). NanoComposix Guidelines for Transmission Electron Microscopy (TEM) Analysis of Nano Particles. Afribary. Retrieved from https://afribary.com/works/nanocomposix-guidelines-for-tem-analysis-1
NWAKPA, UCHECHUKWU "NanoComposix Guidelines for Transmission Electron Microscopy (TEM) Analysis of Nano Particles" Afribary. Afribary, 18 Mar. 2019, https://afribary.com/works/nanocomposix-guidelines-for-tem-analysis-1. Accessed 29 Apr. 2024.
NWAKPA, UCHECHUKWU . "NanoComposix Guidelines for Transmission Electron Microscopy (TEM) Analysis of Nano Particles". Afribary, Afribary, 18 Mar. 2019. Web. 29 Apr. 2024. < https://afribary.com/works/nanocomposix-guidelines-for-tem-analysis-1 >.
NWAKPA, UCHECHUKWU . "NanoComposix Guidelines for Transmission Electron Microscopy (TEM) Analysis of Nano Particles" Afribary (2019). Accessed April 29, 2024. https://afribary.com/works/nanocomposix-guidelines-for-tem-analysis-1